This workshop will focus on general aspects of scanning probe microscopy on nanochemistry. We will have the participation of several speakers to evaluate new horizons using this technique.
Program
09:45 - 10:00h Registration
10:00 - 10:15h Workshop opening by Phd. Jose Carlos Gómez (Rector University of Córdoba, Spain)
10:15 - 11:00h 'A General Introduction to AFM Technique” Phd. Marcel Bus (Delft University of Technology, Delft, The Netherlands)
11:00 - 11:45h 'Atomic Force Microscopy: Basic and Advanced Modes' Phd. Stanislav I. Leesment (NT-MDT, Zelenograd, Russia)
11:45 - 12:15h Coffee break
12:15 - 13:00h 'Friction Microscopy on the Nanoscale: New (Exciting) Applications to Material Science' Phd. Enrico Gnecco (IMDEA Nanoscience, Madrid, Spain)
13:00 - 13:45h 'Advanced SECM possibilities for Energy Devices Research by using an AFM' Phd. Erik M. Kelder (Delft University of Technology, Delft, The Netherlands)
13:45 - 15:00h Lunch time
15:00 - 16:30h System presentation: Ntegra™ Platform a Versatile Nano-Tool – Group 1 (max. 10 people)
16:30 - 18:00h System presentation: Ntegra™ Platform a Versatile Nano-Tool – Group 2 (max. 10 people)